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The Study of Fatigue Behavior of Ductile Cast Iron by Means of X-Ray Fractographic Technique

Published online by Cambridge University Press:  06 March 2019

Zenjiro Yajima
Affiliation:
Department of Mechanical Engineering, Kanazawa Institute of Technology, 7-1 Oogigaoka, Nonoiehi, Kanazawa 921, Japan
Masaki Shinohara
Affiliation:
NEC Corporation, Tamagawa Plant, 1753, Shimonumabe Nakahara-ku, Kawasaki, Kanagawa 211, Japan
Ken-ichi Ishikawa
Affiliation:
Department of Mechanical Engineering, Kanazawa Institute of Technology, 7-1 Oogigaoka, Nonoichi, Kanazawa 921, Japan
Yukio Hirose
Affiliation:
Department of Materials Science, Kanazawa University 1-1 Marunouchi, Kanazawa 920, Japan
Keisuke Tanaka
Affiliation:
Department of Mechanical Engineering, Nagoya University Furoh-cho, Chigusa-ku, Nagoya 464-01, Japan
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Extract

X-ray diffraction observation of metal fractures provides fracture analysis with useful information on the mechanisms and mechanical conditions of fracturing. This method is called “X-ray fractography” and has been developed especially in Japan as a new engineering tool for fracture analysis.

Type
VII. Stress Determination by Diffraction Methods
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Yajima, Z., Hirose, Y., and Tanaka, K., “X-Ray Examination of Fracture Surfaces of Silicon Nitride Ceramics,” Advances in X-Ray Analysis, 33:319 (1990).Google Scholar
2. Yajima, Z., Shimazu, Y., Ishikawa, K., Hirose, Y., and Tanaka, K., “X-Ray Fractographic Study on Fracture Surface Made by Fatigue Crack Propagation Tests of Ductile Cast Iron,” Journal of The Japanese Society for Strength and Fracture of Materials, 22:121 (1988).Google Scholar
3. Yajima, Z., Hirose, Y., and Tanaka, K., X-Ray Fractography of Fatigue Fracture of Low-Alloy Steel in Air and in 3.5% NaCl Solution,” Journal of The Society of Materials Science Japan, 35:725 (1986).Google Scholar
4. Hirose, Y., Yajima, Z., and Tanaka, K.,“X-Ray Fractographic Approach to Fracture Toughness of AISI 4340 Steel,” Advances in X-Ray Analysis, 28:289 (1985).Google Scholar
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