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Stress Measurements with a Two-Dimensional Real-Time System

Published online by Cambridge University Press:  06 March 2019

G.M. Borgonovi  and
C.P. Gazza
G.M. Borgonovi
Affiliation:
Science Applications International Corporation, San Diego, CA
C.P. Gazza
Affiliation:
U.S. Army Materials Technology Laboratory, Watertown, KA
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Extract

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.

Type
VII. X-Ray Stress Analysis
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 397 - 406
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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4. Borgonovi, G.M., “Determination of Residual Stress from Two-Dimensional Diffraction Patterns”, Nondestructive Methods for Material Property Determination, Plenum Publishing Corporation, 47 (1984).Google Scholar