Hostname: page-component-745bb68f8f-s22k5 Total loading time: 0 Render date: 2025-02-05T06:30:49.434Z Has data issue: false hasContentIssue false
  • English
  • Français

Specific Data Handling Techniques and New Enhancements in a Search/Match Program

Published online by Cambridge University Press:  06 March 2019

P. Caussin ,
J. Nusinovici  and
D. W. Beard
P. Caussin
Affiliation:
SOCABIM, 9 bis, villa du Bel -Air 75012 Paris, France
J. Nusinovici
Affiliation:
SOCABIM, 9 bis, villa du Bel -Air 75012 Paris, France
D. W. Beard
Affiliation:
Siemens Analytical X-Ray Instruments, Inc. P.O. Box 5477, Cherry Hill, NJ 08034 U.S.A.
Get access

Abstract

A Search/Match program using digitized X-ray powder diffraction Scans as inputs was presented in 1987 at the Denver Conference. This program has been rewritten to take full advantage of ttie newest capabilities of high end personal Computers. Software improveraents combined with the faster processing speed make it possible to search the 53,791 pattern data base in less than 16 seoonds typically (Compaq Deskpro 386/30 with 9 MB of RAM and 80387-20 numerioal processor), This can be compared to the 90 seconds one year ago. A specific program allows the user to create and, if desired, customize the searoh data base directly from the CD-ROM PDF-2, making Updates much easier. Praotiaal examples are given to illustrate the Operation of the proprietary pattern-recognition algorithm used in the search program.

Type
IX. Qualitative and Quantitative Phase Analysis Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 531 - 538
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Caussln, P., Nuslnovlui, J., Beard, D.W., in Advances in X-Ray Analysis, Vol. 3', 1988, 423-430.Google Scholar
2. Monitjo, B. A., Hewlett-Packard Journal, 39:70 (1988).Google Scholar
3. Johnson, G. G. Jr. , and Vand, V., Ind. Eng. Chem., 59, 19 (1967).Google Scholar