Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-14T09:30:18.771Z Has data issue: false hasContentIssue false
  • English
  • Français

Solid-State Room-Temperature Energy-Dispersive X-Ray Detectors

Published online by Cambridge University Press:  06 March 2019

Andrzej J. Dabrowski
Andrzej J. Dabrowski*
Affiliation:
Medical Imaging Science Group University of Southern California 4676 Admiralty Way, Suite 932, Marina del Rey, CA 90291
Get access

Extract

Over the last several years there has been growing interest directed toward high-resolution energy-dispersive x-ray detectors which operate at room temperature. The goal has been to develop a detector which combines the advantages of room-temperature operation characteristic of scintillation and proportional counters with the excellent energy resolution of silicon and germanium cryogenically cooled spectrometers. The elimination of the cryogenic coolant and the associated vacuum cryostat will permit the design and construction of really miniature and practically convenient x-ray detection systems which will find applications In already existing instruments as well as in various new fields.

Type
I. XRF Detectors and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 1 - 21
Copyright
Copyright © International Centre for Diffraction Data 1981

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Mayer, J.W., Chapter 5 in “Semiconductor Detectors” ed. by Bertolini, G. and Coche, A., North Holland Publishing Co., 1968.Google Scholar
2. Proc. of the Intern. Symp, on Cadmium Telluride, 1971, Strasbourg.Google Scholar
3. Swierkowski, S.P. and Armantrout, G.A., IEEE NS-22, No. 1, (1975) 205.Google Scholar
4. Proc. of the 2nd Symp. on. Cadmium Telluride, 1976, Strasbourg, in Rev. de Physique Applique 12, No. 2 (1977).Google Scholar
5. Armantrout, G.A., Swierkowski, S.P., Sherohman, J.W., and Yee, H., IEEE NS-24 (1977) 121.Google Scholar
6. Proc. of the Intern. Workshop on CdTe and HgI2, 1977, Jerusalem, in Nucl. Instr. and Meth, 150 (1978).Google Scholar
7. Whited, R.C. and Schieber, M.M., Nucl, Instr. and Meth. 162 (1979) 113.Google Scholar
8. Armantrout, G.A., UCRL Preprint 86303 (also in Proc. of Fifth Symp. on X-Ray and Gamma-Ray Sources and Applications, 1981, Ann Arbor, Michigan).Google Scholar
9. Kobayashi, T., Kuru, I., Haia, A., and Sugita, T., IEEE NS-23, No. 1, (1976) 97.Google Scholar
10. Fanish, M.B., Gueisser, H.J., Derick, L., and Sumski, S., Solid State Electronics 9 (1966) 311.Google Scholar
11. Strauss, A.J., Rev, Physique Applique 12 (1977) 176.Google Scholar
12. Matveev, O.A., Prokofiev, S.V., and Rud, Yu. V., Inorg. Mat. 5 (1969) 1175.Google Scholar
13. Kyle, N.R., J. Electrochem. Soc. 118 (1971) 1790.Google Scholar
14. Triboulet, R., Marfaing, Y., Cornet, A., and Siffert, P., J. Appl. Phys. 45 (1974) 2759.Google Scholar
15. Dabrowski, A.J., Iwanczyk, J., and Triboulet, R., Nucl, Instr, and Meth. 118 (1974) 531.Google Scholar
16. Dabrowski, A.J., Iwanczyk, J., and Triboulet, R., Nucl. Instr. and Meth. 126 (1975) 417.Google Scholar
17. Dabrowski, A.J., Chwaszczewska, J., Iwanczyk, J., Triboulet, R., and Marfaing, Y., IEEE NS - 23, No. 1 (1976) 171.Google Scholar
18. Iwanczyk, J., Szymczyk, W.M., Traczyk, M., and Triboulet, R., Nucl. Instr, and Meth. 165 (1979) 289.Google Scholar
19. Dabrowski, A.J., Iwanczyk, J.S., Szymczyk, W.M., Kokoschinegg, P., Stelzhammer, J., and Triboulet, R., Nucl. Inst, and Meth. 150, (1978) 25.Google Scholar
20. Saura, J. and Regolini, J.L., J. Cryst. Growth 15 (1972) 307.Google Scholar
21. Ponpon, J.P., Stuck, R., Siffert, P., Meyer, B., and Schwab, C., IEEE NS - 22, No. 1 (1975) 182.Google Scholar
22. Scholtz, E., Acta Electronics 17 (1974) 69.Google Scholar
23. Schieber, M., Schnepple, W.F., and van den Berg, L., J. Cryst. Growth 33 (1976) 125.Google Scholar
24. Faile, S.P., Dabrowski, A.J., Huth, G.C., and Iwanczyk, J.S., J. Cryst. Growth 50 (1980) 752.Google Scholar
25. Barton, J.B., Dabrowski, A.J., Iwanczyk, J.S., Kusmiss, J.H., Ricker, G., Vallerga, J., Warren, A., Squillante, M,R., Lis, S., and Entine, G., in this volume (Advances in X-Ray Analysis 25).Google Scholar
26. Swierkowski, S.P., Armantrout, G.A., and Wichner, R., IEEE Trans. on Nuclear Science MS - 21, No. 1 (1974) 302.Google Scholar
27. Cho, Z.H., Watt, M.K., Slapa, M., Tove, P.A., Schieber, M., Davies, T., Schnepple, W., and Randtke, P. IEEE MS - 22, Mo. 1, (1975) 229.Google Scholar
28. Slapa, M., Huth, G.C., Seibt, W., Schieber, M.M., and Randtke, P.T., IEEE NS - 23, No. 1 (1976) 102.Google Scholar
29. Seibt, M., Slapa, M., and Huth, G.C., Nucl. Instr. and Meth. 135, (1976) 573.Google Scholar
30. Dabrowski, A.J. and Huth, G.C., IEEE N S - 25, No. 1 (1978) 205.Google Scholar
31. Dabrowski, A.J., Huth, G.C., Singh, M., Economou, T.E., and Turkevich, A.L., Appl. Phys. Lett. 33 (1978) 211.Google Scholar
32. Huth, G.C., Dabrowski, A.J., Singh, M., Economou, T.E., and Turkevich, A.L., Advances in X-Ray Analysis 22 (1979) 461.Google Scholar
33. Singh, M., Dabrowski, A.J., Huth, G.C., Iwanczyk, J.S., Clark, B., and Baird, A.K., Advances in X-Ray Analysis 23 (1980) 249.Google Scholar
34. van den Berg, L. and Whited, R.C., IEEE NS - 25, No. 1 (1978) 395.Google Scholar
35. Schieber, M., Beinglass, I., Dishon, G., Holtzer, A., and Yaron, G., Nucl. Instr. and Meth. 150 (1978) 71.Google Scholar
36. Iwanczyk, J.S., Dabrowski, A.J., Huth, G.C., Del Duca, A., and Schnepple, W., IEEE NS - 28, No. 1 (1981) 579.Google Scholar
37. Dabrowski, A.J., Iwanczyk, J.S., Barton, J.B., Huth, G.C., Whited, R., Ortale, C., Economou, T.E., and Turkevich, A.L., IEEE NS - 28, No. 1, (1981) 536.Google Scholar
38. Iwanczyk, J.S., Kusmiss, J.H., Dabrowski, A.J., Barton, J.B., Huth, G.C., Economou, T.E., and Turkevich, A.L., Proc. of the 5th Symp, on X- and Gamma-Ray Sources and Applications, 1981, Ann Arbor, Michigan.Google Scholar
39. Storm, E., Gilbert, D., and Israel, H., Nucl. Data Tables A 7, (1970) 565.Google Scholar
40. Klein, C.A., J. Appl. Phys. 39 (1968) 2029.Google Scholar
41. Ramo, S., Proc. of the IRE (1939) 584.Google Scholar
42. Fano, U., Phys. Rev. 70 (1946) 44 and 72 (1947) 26.Google Scholar
43. Llacer, J., Haller, E., Cordi, R.C., IEEE NS - 24, No. 1 (1977) 53.Google Scholar
44. Slapa, M., Chwaszczewska, J., Jurkowski, J., Latuszynski, A., Huth, G.C., and Dabrowski, A.J., in this volume (Advances in X-Ray Analysis, Volume 25, Plenum Publishing Corp., New York and London).Google Scholar
45. Day, R.B., Dearnley, G., and Palms, J.M., IEEE MS-14 (1967) 487.Google Scholar
46. Iwanczyk, J.S. and Dabrowski, A.J., Nucl. Instr. and Meth. 134, (1976) 505.Google Scholar
47. Singh, M., Clark, B.C., Dabrowski, A. J., Iwanczyk, J.S., Leyden, D.E., and Baird, A.K., Advances in X-Ray Analysis 24 (1981) 337.Google Scholar
48. Zanio, K., Mucl. Instr. and Meth. 83 (1970) 288.Google Scholar
49. Slapa, M., Hahn, G., Chwaszczewska, J., Dabrowski, A.J., Iwanczyk, J.S. Iwanczyk, J.S., and Huth, G.C., Nucl. Instr. and Meth. 176 (1980) 567.Google Scholar
50. Dabrowski, A.J., Singh, M., Huth, G.C., and Iwanczyk, J.S., Proc. of the Workshop on Energy Dispersive X-Ray Spectrometry (1979), Gaithersburg, Maryland; published as MBS Special Publication 604.Google Scholar
51. Goulding, F.S., Nucl. Instr. and Meth. 142 (1977) 213.Google Scholar
52. Dabrowski, A.J., Chwaszczewska, J., Iwanczyk, J., Triboulet, R., and Marfaing, Y., Revue de Physique Applique 12 (1977) 297.Google Scholar