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A Simple Setup for Glancing Angle Powder Diffraction with a Sealed X-Ray Tube

Published online by Cambridge University Press:  06 March 2019

P. Georgopoulos
Affiliation:
Department of Materials Science and Engineering McCormick School of Engineering and Applied Science Northwestern University Evanston, Il, 60208
J.R. Levine
Affiliation:
Department of Materials Science and Engineering McCormick School of Engineering and Applied Science Northwestern University Evanston, Il, 60208
Y.W. Chung
Affiliation:
Department of Materials Science and Engineering McCormick School of Engineering and Applied Science Northwestern University Evanston, Il, 60208
J.B. Cohen
Affiliation:
Department of Materials Science and Engineering McCormick School of Engineering and Applied Science Northwestern University Evanston, Il, 60208
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Extract

The pioneering work of Marra, Eisenberger and Cho (1979) demonstrated that powder diffraction from near surface and interfacial regions could be obtained using glancing incidence geometry. This has generated considerable interest in research at synchrotron sources, but also several slit attachments have been developed for commercial diffractometers. By adding a focussing mirror, we demonstrate here a simple arrangement that produces adequate intensity with a sealed tube to examine ultra thin films.

Type
III. Thin-Film and Surface Characterization by XRD
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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