Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-12-01T03:32:33.032Z Has data issue: false hasContentIssue false
  • English
  • Français

Rietveld Analysis and Pair Wise Substitutional Alloys

Published online by Cambridge University Press:  06 March 2019

Wayne D. Kaplan  and
Giora Kimmel
Wayne D. Kaplan
Affiliation:
Department Materials Engineering Technion, Haifa, Israel
Giora Kimmel
Affiliation:
Department Materials Engineering Technion, Haifa, Israel
Get access

Abstract

Rietveld Analysis on X-Ray powder diffraction data was used to build a comprehensive model of the structures in gallmm rich R-Ga systems (R is a rare earth between La and Gd). The ability to refine occupation factors as well as atomic positions allowed for the analysis of the e solid solution, its structural relation to the ordered ∊′ phase, and the unique role of the Ga-Ga pairs in these systems.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 63 - 68
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kimmel, G., Dayan, D., Zevin, L., Pelleg, J., The Structure of R(1-x)Ga2(1-x) (0 < x < 0.33) And Its Relation to RGa (R=Rare Earth Element) and Ga, Metallurgical Transactions A, 16A:167–171,1985.Google Scholar
2. Raszko, S.B., Rare-Earth Galliutn Compounds Having The Aluminium- Boride Structure, Transactions of The Metallurgical Society of AIME, 221: 201-202, 1961.Google Scholar
3. Kimmel, G. and Kaplan, W.D., A New Phase Dransition Phenomenon In Gallium-Lanthanide Binary Alloys, Scripta Metallurgica, 25: 571-574, 1991.Google Scholar
4. Zevin, L., Pelleg, J., Kimrael, G., Dayan, D., Positional And Orientational Ordering In La1-xGa2(1+x) And Formation Of LaGa4, Scripta Metallurgies., 18: 1257–1261, 1984.Google Scholar
5. Hill, R.J., Madsen, I.C., The Effect of Profile Step Width on the Determination of Crystal Structure Parameters and Estimated Standard Deviations by X-Ray Rietveld Analysis. Appl, Cryst., 19: 10-18, 1986.Google Scholar
6. Kimmel, G., High Quality Diffraction Data Using An Adjustable Divergence Slit and Thin Samples, Powder Diffraction. 2;(1):22–28, 1987.Google Scholar
7. Wiles, D.B., Young, R.A., A New Computer Program for Rietveld Analysis of X-Ray Powder Patterns, J.Appl. Cryst., 14: 149-151, 1981.Google Scholar
8. Howard, C.J., Hill, R.J., A Computer Program For Rietveld Analysis of Fixed Wavelength X-Ray and Neutron Powder Diffraction Patterns, Australian Atomic Energy Commission, Report No. M112, 1986.Google Scholar
9. Dayan, D., Atemony, U., Dariel, M.P., Inierdiffusion Studies of Rare Earth Metals With Liquid Gallium, J. Less-Common Metals, 87: 87–98,1982.Google Scholar