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Published online by Cambridge University Press: 06 March 2019
In the field of X-ray stress analysis, a diffraction plane at a high Bragg angle region has to be selected in order to determine the precise value of stress. But stress analysis using a most desired (hkl)- plane is not always possible. The use of synchrotron radiation (SR) enables the stress analysis using many (hkl)-planes with high accuracy by providing a perfectly monochromaticed X-ray beam having an optional wave length. Such features of SR ate most suitable for the stress analysis on materials having preferred orientation.