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Recent Developments in Txrf of Light Elements

Published online by Cambridge University Press:  06 March 2019

Christina Streli ,
V. Bauer  and
P. Wobrauschek
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
V. Bauer
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
P. Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
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Abstract

Total Reflection X-ray Fluorescence Analysis (TXRF) has been proved to be well suited for the energy dispersive analysis of light elements, as B, C, N, O, F, Na, Mg,.,. using a special spectrometer. It is equipped with a Ge(HP) detector offering a sufficient detection efficiency from 180 eV upwards. The obtainable detection limits especially of the light elements are mainly influenced by the excitation source, which should provide a large number of photons with an energy near the K-absorption edge of these elements (from 200 eV upwards). Commercially available X-ray tubes do not offer characteristic X-rays in that range. In former experiments a windowless X-ray tube was built to prevent the low energy X-rays from being attenuated in the Be window. Experiments have been performed using Cu as anode material.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 771 - 779
Copyright
Copyright © International Centre for Diffraction Data 1995

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