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Quantitative X-Ray Diffraction Analysis of Smectites: II -- Reference Intensity Ratio Calculations for Smectite Analysis

Published online by Cambridge University Press:  06 March 2019

Hong Chen  and
Briant L. Davis
Hong Chen
Affiliation:
Engineering and Mining Experiment Station (EMES) South Dakota School of Mines and Technology Rapid City, South Dakota 57701-3995
Briant L. Davis
Affiliation:
Engineering and Mining Experiment Station (EMES) South Dakota School of Mines and Technology Rapid City, South Dakota 57701-3995
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In quantitative x-ray diffraction (XRD) analysis, the reference intensity ratio (ki or RIR) is one of the most important parameters of the reference intensity method (RIM). The ki is a function of the intensity of x-ray reflection and the mass attenuation coefficient of the sample for the “Lki” method (Davis, 1992). The intensities for 00l reflections have been calculated, and also the reference intensity ratios corresponding to the 001 reflection have been estimated in this part of the work, which is very important for investigating the iron influence on the XRD analysis of smectites. The Reynolds’ proposed glycol-expanded montmorillonite structure was used as a basis for the calculations.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 599 - 606
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

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