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Published online by Cambridge University Press: 06 March 2019
Recently, layered structure analyzers (called LSA for short) or layered synthetic microstructures (called LSM) with d spacing of several tens of Å, have been developed for use as X-ray analyzing devices in wave-length dispersive spectrometers. The lower detection limit for light elements of atomic numbers lower than 13 , such as aluminum, sodium, fluorine, oxygen, carbon and so on, has been greatly improved.
There have been several reports published regarding LSA (or LSM) applications to light element analyses.