Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-08T05:09:53.640Z Has data issue: false hasContentIssue false
  • English
  • Français

Picosecond X-ray Diffraction: System and Applications

Published online by Cambridge University Press:  06 March 2019

I. V. Tomov ,
P. Chen  and
P. M. Rentzepis
I. V. Tomov
Affiliation:
Department of Chemistry, University of California, Irvine CA 92717
P. Chen
Affiliation:
Department of Chemistry, University of California, Irvine CA 92717
P. M. Rentzepis
Affiliation:
Department of Chemistry, University of California, Irvine CA 92717
Get access

Abstract

We report the development of a novel, pulsed x-ray diffraction system with picosecond time resolution. The system has been used to study the heat transport in gold, platinum and silicon crystals heated by 10 ps, 193 nm laser pulses. Further developments and applications of time resolved picosecond x-ray diffraction are discussed.

Type
I. Dynamic Characterization of Materials by Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 21 - 33
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lunney, J. G., Dobson, P. J., Hares, J.D., Tabatabaei, S.D., and Eason, R. W., Opt. Commun. 58, 269 (1986).Google Scholar
2. Larson, B. C. and Tischler, J. Z., SPIE 1345, 90 (1990).Google Scholar
3. Larson, B. C., Tischler, J. Z. and Mills, D. M., J. Mater. Res. 1, 144 (1986).Google Scholar
4. Kojima, S., Maekawa, I., Kawado, S., Takahashi, T., Ishikawa, T., and Kikuta, S., Rev. Sci. Instrum. 63, 1164 (1992).Google Scholar
5. Bushchert, J. R., Tischler, J. Z., Mills, D. M., Zhao, Q., and Colella, R., J. Appl. Phys. 66, 3523 (1989).Google Scholar
6. Wark, J. S., Riley, D., Woolsey, N. C., Keihnand, G., and Whitlock, R. R., J. Appl. Phys., 68, 4531 (1990).Google Scholar
7. Woolsy, N. C., Wark, J. S. and Riley, D., J. Appl. Cryst. 23, 441 (1990).Google Scholar
8.Discussions on time resolved macromolecular crystalography”, Royal Soc. Phyl. Trans., 340, No 1657, pp 167–334 (1992).Google Scholar
9. Helliwell, J. R., Royal Soc. Phyl. Trans., 340, 221 (1992).Google Scholar
10. Bartunik, H. D., Jerzembek, E., Pruss, D., Huber, G. and Watson, H. C., Acta Cryst, A37, 652 (1981).Google Scholar
11. Moffat, K., Szebenyi, D. and Bildrback, D. H., Science, 223, 1423 (1984).Google Scholar
12. VanWonterghem, B. and Rentzepis, P. M., Proc. SPIE, 1204, 784 (1990).Google Scholar
13. Anderson, T., Tomov, I. V. and Rentzepis, P. M., J. Chem. Phys., 99, 869 (1993).Google Scholar
14. Tomov, I. V., Anderson, T. and Rentzepis, P. M., J. X-ray Sci. Technol., 4, 44 (1993).Google Scholar
15. Tomov, I. V., Anderson, T., and Rentzepis, P. M., Appl. Phys. Lett 61, 1157 (1992); 61, 3193E (1992).Google Scholar
16. Girardeau, C.-Montaut, Girardeau-Montaut, J. P. and Leboutet, H., Appl. Phys. Lett 55, 2556 (1989).Google Scholar
17. Tomov, I. V., Chen, P. and Rentzepis, P. M., J. Appl, Cryst (to be published).Google Scholar
18. James, R. W., “The Optical Principles of the Diffraction of X-rays”, Ox Bow Press, Woodbridge, Connecticut, 1982.Google Scholar
19. Sears, V. F. and Shelley, S. A., Acta Cryst, A47, 441 (1991).Google Scholar
20. Buschcrt, J. R. and Colefia, R., Solid State Commun., 80, 419 (1991).Google Scholar
21. Tang, D. W., Zhou, B. L., Cao, H. and He, G. H., J. Appl. Phys., 73, 3749 (1993).Google Scholar
22. Bechtel, J. H., J. Appl. Phys., 46, 1585 (1975).Google Scholar
23. Brorson, S. D., Fujimoto, J. G. and Ippen, E. P., Phys. Rev. Lett., 59, 1962 (1987).Google Scholar
24. Bloembergen, N., Mat. Res. Soc. Symp. Proc, 51, 3 (1985).Google Scholar