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A Phi-Psi-Diffract (Meter for Residual Stress Measurements

Published online by Cambridge University Press:  06 March 2019

C.N.J. Wagner ,
M.S. Boldrick  and
V. Perez-Mendez
C.N.J. Wagner
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
M.S. Boldrick
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
V. Perez-Mendez
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
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Abstract

A ϕ-ψ diffractometer has been designed and constructed to evaluate residual stresses in polycrystalline samples by x-ray diffraction. It permits rotations of the x-ray diffraction apparatus, consisting of an x-ray tube and a position-sensitive proportional counter, about two axes ϕ and ψ. The ϕ-rotation from 0° to 360° is carried out about the normal to the surface of the stationary sample, whereas the ψ-motion consists of a rotation from -45° to +45° about an axis lying in the sample surface and the diffraction plane, but perpendicular to the diffraction vector. This ϕ-ψ diffractometer permits the application of the ϕ- and ψ-differential and integral methods for the evaluation of the strain tensor and its gradient averaged over the depth of x-ray penetration into the sample. Assuming that isotropic elasticity theory is applicable, the stress tensor can then be evaluated from the measured strain tensor.

Type
V. X-Ray Stress Determination, Position Sensitive Detectors, Fatigue and Fracture Characterization
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 275 - 282
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

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