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Performance Characteristics of a High Resolution Si(Li) Detector Using a Time Variant Amplifier and a Pulsed Source of X-Rays

Published online by Cambridge University Press:  06 March 2019

M. A. Short  and
T. G. Gleason
M. A. Short
Affiliation:
Occidental Research Corporation Irvine, CA 92713
T. G. Gleason
Affiliation:
Occidental Research Corporation Irvine, CA 92713
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Extract

Two recent improvements in energy dispersive spectrometry are the development of time variant amplifiers and the introduction of pulsed X-ray sources. Either pulsed X-ray tubes or electron beams with fast beam blanking may be used.

Time variant amplifiers designed by Kandiah (1 ,2) used control logic to co-ordinate charge restoration of the detector preamplifier, pole-zero cancellation and baseline restoration. In the pulse shaping circuit, time constants are switched during the processing of each pulse to optimize throughput, baseline stability and pileup rejection. Pulse processing techniques have been discussed by Statham (3) .

Type
I. XRF Detectors and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 45 - 48
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

1. Kandiah, K., Nucl. Instrum. Meth., 95, 289 (1971).Google Scholar
2. Kandiah, K., in : Physical Aspects of Electron Microscopy and Microbeam Analysis, Siegel, B. M. and Beaman, D. R., eds., John Wiley, New York, p. 393 (1975).Google Scholar
3. Statham, P. J., in : Energy Dispersive X-Ray Spectrometry, NBS Special Publication 604, Heinrich, K. F. J., Newbury, D. E., Myklebust, R. L. and Fiori, C. I., eds., p. 141 (1981).Google Scholar
4. Jaklevic, J. M., Goulding, F. S. and Landis, D. A., IEEE Trans. Nucl. Sci. NS-19, 392 (1972).Google Scholar
5. Stewart, J. E., Zulliger, H. R. and Drummond, W. E., in : Advances in X-Ray Analysis, Gould, R. W. etal., eds., Kendall/Hunt, Dubuque, Iowa, 19, 153 (1976).Google Scholar
6. Jaklevic, J. M., Landis, D. A. and Goulding, F. S., in : Advances in X-Ray Analysis, Gould, R. W. etal., eds., Kendall Hunt, Dubuque, Iowa 191, 253 (1976).Google Scholar
7. Statham, P. J., Long, J. V. P., White, G. and Kandiah, K., X-ray Spectrons., 3, 153 (1974).Google Scholar