Hostname: page-component-745bb68f8f-g4j75 Total loading time: 0 Render date: 2025-01-11T13:30:36.118Z Has data issue: false hasContentIssue false
  • English
  • Français

Peak Broadening in Asymmetric X-Ray Diffraction Resulting from Chi Tilts

Published online by Cambridge University Press:  06 March 2019

Danut Dragoi ,
T. R. Watkins  and
K. J. Kozaczek
Danut Dragoi
Affiliation:
University of Denver, Denver CO, U.S.A.
T. R. Watkins
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, P.O. Box 2008, Oak Ridge, Tennessee 37831-6064, U.S.A.
K. J. Kozaczek
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, P.O. Box 2008, Oak Ridge, Tennessee 37831-6064, U.S.A.
Get access

Abstract

The objective of this study was to measure the peak broadening inherent in chi (x) tilting and compare that to a geometrical model. The (012) and (300) reflections from a Al2O3 plate (NIST SRM 1976) were each scanned every 100 from -700 to +700x (15 lilts/reflection) to examine the influence of a low and high 2θ, respectively. The absorption correction was not taken into account. The equation y=2m1| tan x | cosθ+m2 fits well the data from both low and high 2θ except the point x =0. The extended equation y=m1cosh(m2tan x cosθ) fits well with all the experimental points.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 499 - 503
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cullity, B. D., (1978), “Elements of X-Ray Diffraction”, Addison-Wesley Publishing Company, Inc. Dragoi, D., (1993), Adv, X-Ray Analysis, Vol. 36, 605.Google Scholar