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Pc Software for Rim Quantitative X-Ray Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

BriantL. Davis
BriantL. Davis*
Affiliation:
Davts Consulting Group 4022 Helen Court, Rapid City, SD 57702
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Extract

Quantitative multicomponent analysis of phases by x-ray diffraction still remains one of the most difficult applications of any element or phase spectroscopic method. The level of quality of XRD quantitative analysis is largely in the hands of the operator, but several relatively new methods for processing basic diffraction data are becoming known and more frequently used, including fulltrace (observed and calculated) subtraction methods (Smith et al, 1988), Rietveld procedures (Bish and Howard, 1988; Taylor and Aldridge, 1993), and chemical “apportionment” target-transformation methods (Starks, et al, 1984). In spite of these new advances, the single or multiple peak reference intensity ratio (RIR, or kj) procedure remains a simple and attractive technique for routine quantitative XRD analysis (Schreiner, 1995; Snyder, 1992; Davis, 1992).

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 589 - 597
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

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