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The On-Stream X-Ray Analysis of Slurries for Process Control
Published online by Cambridge University Press: 06 March 2019
Abstract
An integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dispersive XRF spectrometer measures the reflected fluorescence intensities. Examples and data from the onstream XRD analysis of fluorspar and apatite are presented. Mention is made of the application of an integrated XRD-XRF system in the heavy-minerals and base-metal industries.
- Type
- IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
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- Copyright © International Centre for Diffraction Data 1991