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On the Primary X-Ray Analyzer

Published online by Cambridge University Press:  06 March 2019

Shizuo Kimoto ,
Masayuki Sato ,
Hitoshi Kamada  and
Takuzi Ui
Shizuo Kimoto
Affiliation:
Japan Electron Optics, Laboratory Co., Ltd. Tokyo, Japan
Masayuki Sato
Affiliation:
Japan Electron Optics, Laboratory Co., Ltd. Tokyo, Japan
Hitoshi Kamada
Affiliation:
University of Tokyo Tokyo, Japan
Takuzi Ui
Affiliation:
University of Tokyo Tokyo, Japan
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Abstract

The primary X-ray analyzer is used for nondestructive spectrochemical analysis of solid specimens. Accelerated electron beams bombard the specimen surface directly and generate primary X-rays which are measured in a vacuum spectrometer. The method of primary X-ray spectroscopy is superior to the fluorescence X-ray spectroscopy because (1) detectable sensitivity for such light elements as magnesium and aluminum is very high, and (2) the correction of the measured value for self-absorption of X-rays by the specimen itself is low. The performance of the instrument and applications are reported.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 508 - 514
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium,'Fluorine, Oxygen, Nitrogen, Carbon, and Boron,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 460.Google Scholar
2. Fox, J. G. M., “X-Ray Spectrometric Determination of Light Elements Using Direct Electron Excitation,” J. Inst. Metals 91: 239, 1962-63.Google Scholar
3. Spielberg, N., “Sensitivity of X-ray Spectro-chemical Analysis of Steel by Electron Excitation,” in : X-Ray Optics and X-rdy Microanalysis, Academic Press, New York, 1963.Google Scholar