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Nonlinear Equations for High Accuracy X-Ray Crystal Orientation

Published online by Cambridge University Press:  06 March 2019

Danut Dragoi
Danut Dragoi*
Affiliation:
Enterprise for Research and Production of Semiconductor Materials Sos. Garii Catelu Str., 5 Sector 3, Bucharest, Romania
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Abstract

Nonlinear equations are given for determining the crystallographic orientation of surfaces of single crystals. The equations are solved by an iterative method in several variables. The angle ϕ between the surface plane and the lattice plane in question is decomposed into two components α and β. These two components are obtained from the solution of a non-linear system of equations using two measurements and the Bragg angle. The diffractometric system considered is the well known θ/2θ with a sufficiently large area of x-ray detection and the capability of holding single crystal samples. The results obtained are discussed from experimental and theoretical points of view.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 681 - 685
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

ASTM F26-84. (1984). “Standard Method for Determining the Orientation of a Semiconductive Single Crystal”, American Society for Testing and Materials. 1916 Race Str. Philadelphia PA.Google Scholar
ASTM E82-84. (1984).“Standard Method for Determining the Orientation of a Metal Crystal”, ibid.Google Scholar
ASTM F 847-83 (1983). “Measuring Crystallographic Orientation of Flats on Single Crystal Silicone Slices and Wafers by X-Ray Techniques”, ibid.Google Scholar
ASTM F 848-83 (1983). “Standard Method for Determining the Lattice Constant of Single Crystal Gadolinium Gallium Garnet”, ibid.Google Scholar
Dragoi, D. (1993) J. Appl. Cryst.. in the press.Google Scholar
Kantorovich, L.V. & Akilov, G.P. (1977). Functionalinii Analiz, Moskva, Nauka.Google Scholar
Lal, K., Bhagavannarayana, G., Kumar, V., Halder, S.K. (1990). Meas. Sci. Technol. 1, 793–800.Google Scholar