Hostname: page-component-745bb68f8f-cphqk Total loading time: 0 Render date: 2025-01-27T17:09:17.326Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Position Sensitive Detector for X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

J. L. Radtke  and
D. W. Beard
J. L. Radtke
Affiliation:
Reflection Imaging, Inc., Madison, WI 53705
D. W. Beard
Affiliation:
Reflection Imaging, Inc., Madison, WI 53705
Get access

Abstract

Position sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 617 - 622
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Gates, S. C., 1989, “Laboratory Automation Using the IBM PC,” Prentice Hall, Englewood Cliffs, New Jersey.Google Scholar
Knoll, G. F., 1989, “Radiation Detection and Measurement,” John Wiley and Sons, New York, New York.Google Scholar
Wölfel, E. R., 1983, A Novel Curvsd Position-Sensitive Proportional Counter for X-ray Diffractoraetry, J. Appl. Cryst, 16:341.Google Scholar