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New Developments in FP-Based Software for Both Bulk and Thin-Film XRF Analysis

Published online by Cambridge University Press:  06 March 2019

Liangyuan Feng ,
Brian J. Cross  and
Richard Wong
Liangyuan Feng
Affiliation:
Kevex Instruments 355 Shoreway Rd. San Carlos, CA 94070
Brian J. Cross
Affiliation:
Kevex Instruments 355 Shoreway Rd. San Carlos, CA 94070
Richard Wong
Affiliation:
Kevex Instruments 355 Shoreway Rd. San Carlos, CA 94070
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Extract

In the last decade, the Fundamental Parameter (FT) method has been increasingly used in quantitative XRF analysis as an effective means for interelement effect corrections. Many authors have contributed to its continuous development both in theory and practice [1 - 26]. Among various implementations, the FP-alpha method has been used widely in bulk-sample analysis because of its unique advantage of speed [1 - 6]. In recent years, however, with the advent of faster computers, a rigorous full FP approach has become feasible and practical. This is especially true in the field of multilayer thin-film, analysis, where the FP-alpha approach has not yet been applied.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 703 - 709
Copyright
Copyright © International Centre for Diffraction Data 1991

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