Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-09T15:37:07.497Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructoral and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope

Published online by Cambridge University Press:  06 March 2019

A. D. Romig Jr.
A. D. Romig Jr.*
Affiliation:
Sandia National Laboratories Albuquerque, NM 87185
Get access

Extract

This plenary paper is intended to be an introduction to the capabilities and limitations of analytical electron microscopy (AEM). The description to be given assumes no prior knowledge of AEM or any other electron microscopy, scanning or transmission. However, a basic understanding of x-ray generation and detection will be assumed.

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 9 - 24
Copyright
Copyright © International Centre for Diffraction Data 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Romig, A.D. Jr.,, Analytical Transmission Electron Microscopy, In: “Materials Characterization,” vol. 10 of the Metals Handbook, American Society for Metals, Metals Park, OH (1986).Google Scholar
2. Edington, J.W., “Practical Electron Microscopy in Materials Science,” Van Nostrand Reinhold, New York (1976).Google Scholar
3. Williams, D.E., “Practical Analytical Electron Microscopy in Materials Science,” Philips Electronic Instruments, Inc., Mahwah, NJ (1984).Google Scholar
4. Joy, D.C., Romig, A.D. Jr., and Goldstein, J.I., “Principles of Analytical Electron Microscopy,” Plenum Press, New York (1986).Google Scholar
5. Joy, D. C., Newbury, D.E. and Davidson, D.L., Electron Channeling Patterns in Che Scanning Electron Microscope, J. Appl. Phys. 53: R81 (1982).Google Scholar
6. Goldstein, J.I., Costley, J.L., Lorimer, G.W. and Reed, S.J.B., Quantitative X-Ray Analysis in the Electron Microscope, in: “Scanning Electron Microscopy/1977,” ed. Johari, O., Chicago, I.T. 1: 315 (1977).Google Scholar
7. Tanaka, M. and Terauchi, M., “Convergent-Beam Electron Diffraction,” JEOL. Ltd., Tokyo, Japan (1985).Google Scholar
8. Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Fiori, C.E. and Lifshin, E, “Scanning Electron Microscopy and X-ray Microanalysis,” Plenum Press, New York (1981),Google Scholar
9. Cliff, G. and Lorimer, G.W., The Quantitative Analysis of Thin Specimens, J. Microscopy, 103: 203 (1975).Google Scholar
10. Romig, A.D. Jr.,, “X-Ray Microanalysis in the Analytical Electron Microscope,” Sandia National Laboratories Report, SAND82-2938, Albuquerque, New Mexico (1983).Google Scholar
11. Romig, A.D. Jr., and Carr, M.J., Thickness and Extinction Distance Measurements in Heavy Metal Thin Foils by Convergent Beam Electron Diffraction and X-Ray Absorption, in: “Analytical Electron Microscopy - 1984, ed. Joy, D.C. and Williams, D.B., San Francisco Press, San Francisco, CA, 111 (1984).Google Scholar
12. leo, B.K. and Joy, D.C., “EXAFS Spectroscopies: Techniques and Applications,” Plenum Press, New York (1981).Google Scholar