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Low Energy Mass Absorption Coefficients from Proton Induced X-ray Spectroscopy

Published online by Cambridge University Press:  06 March 2019

A. Lurio
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
W. Reuter
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
J. Keller
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
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Abstract

We describe a new and reliable experimental technique for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique, the absorbing film is supported directly on a substrate which under proton bombardment will generate the x-rays whose absorption will be measured. Results are given for thirteen different metals at the C Kα (277 eV) line.

Type
X-Ray Fluorescence
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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