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Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry

Published online by Cambridge University Press:  06 March 2019

Y. Tada ,
Y. Sako ,
K. Iwamoto ,
S. Gonsui  and
T. Arai
Y. Tada
Affiliation:
Rigaku Industrial Corporation, Takatsuki, Osaka, Japan
Y. Sako
Affiliation:
Rigaku Industrial Corporation, Takatsuki, Osaka, Japan
K. Iwamoto
Affiliation:
Rigaku Industrial Corporation, Takatsuki, Osaka, Japan
S. Gonsui
Affiliation:
Rigaku Industrial Corporation, Takatsuki, Osaka, Japan
T. Arai
Affiliation:
Rigaku Industrial Corporation, Takatsuki, Osaka, Japan
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Extract

X-ray fluorescence spectrometry has been used in a broad spectrum of applications. These include elemental analysis, both qualitative and quantitative, based on wavelength dispersive (WDXRF) or energy dispersive (EDXRF) methods. In these methods the detection limit of analyte elements is mainly in the one to ten ppm range in solid samples. Therefore, improvement of these limits is desirable for many useful applications. In this context it is essential to remember that the excitation efficiency for fluorescent X-rays is very low when compared with electron or proton excitation. In the case of WDXRF, the dominant factor is the low reflectivity from the analyzing crystal.

Type
IV. Techniques and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 131 - 139
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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