Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-09T15:40:49.898Z Has data issue: false hasContentIssue false
  • English
  • Français

Instantaneous Display of X-Ray Diffraction using a Diode Array Camera Tube

Published online by Cambridge University Press:  06 March 2019

Arthur N. Chester  and
Fred B. Koch
Arthur N. Chester
Affiliation:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey 079714
Fred B. Koch
Affiliation:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey 079714
Get access

Abstract

The silicon diode array camera tube, recently developed for PICTURFPHONE® service, was modified to permit X-ray imaging. High quantum efficiency is attained without the use of a phosphor screen, since each photon absorbed in the silicon target generates several hundred hole-electron pairs for each keV of its energy, most of which can he usefully collected. The sensitivity and resolution are adequate to allow a continuous television display of the diffracted intensity as a crystal is oriented. Particular advantages of this technique include; high resolution (< 25 μm); electronically variable magnification; direct oscilloscope measurement of X-ray spot Intensity profiles and relative spot intensities because signal current is directly proportional to photon flux; high sensitivity in the range of 0.6 to 5.0 Å, potentially limited only "by counting statistics; integration times variable from < 1/60 second to minutes; and expected low cost, since the camera tube has no complicated electron imaging, and is directly interchangeable Mith a standard television vidicon. Applications which are described include crystal orientation and X-ray topography.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 165 - 173
Copyright
Copyright © International Centre for Diffraction Data 1968

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Crowell, M. H., Buck, T. M., Labuda, E. F., Dalton, J. V., and Walsh, E. J., “A Camera Tube with a Silicon Diode Array Target,” B.S.T.J. 46, 491 (1967).Google Scholar
2. Chester, A. N., Lcomis, T. C., and Weiss, M. M., “Diode Array Camera Tubes and X-ray Imaging,” Conference on Electron Device Research, Boulder, Colorado, June 19-21, 1968 (to be published).Google Scholar
3. Dozier, C. M., Gilfrich, J. V., and Birks, L. S., “Quantitative Calibration of X-ray Film Response in the 5 KeV to 1.3 MeV Region,” Appl. Optics 6, 2136 (1967).Google Scholar
4. Lonsdale, K., “Divergent-Beam X-ray Photography of Crystals,” Phil. Trans. Royal Roc. (London) 240, 219 (1947).Google Scholar
5. Barrett, C. S., “A New Microscopy and Its Potentials,” Trans. A.I.M.E. 161, 15 (1945).Google Scholar