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How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

Published online by Cambridge University Press:  06 March 2019

H. Schwenke ,
W. Berneike ,
J. Knoth  and
U. Weisbrod
H. Schwenke
Affiliation:
Institute of Physics, GKSS Research Centre Geesthacht, P.O.Box: 1160, 2054 Geesthacht, Federal Republic of Germany
W. Berneike
Affiliation:
Institute of Physics, GKSS Research Centre Geesthacht, P.O.Box: 1160, 2054 Geesthacht, Federal Republic of Germany
J. Knoth
Affiliation:
Institute of Physics, GKSS Research Centre Geesthacht, P.O.Box: 1160, 2054 Geesthacht, Federal Republic of Germany
U. Weisbrod
Affiliation:
Institute of Physics, GKSS Research Centre Geesthacht, P.O.Box: 1160, 2054 Geesthacht, Federal Republic of Germany
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Abstract

The total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

Type
IV. Techniques and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 105 - 114
Copyright
Copyright © International Centre for Diffraction Data 1988

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