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High Resolution X-Ray Fluorescence Si Kβ Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts

Published online by Cambridge University Press:  06 March 2019

J Purton ,
D S Urch  and
N G West
J Purton
Affiliation:
Chemistry Department, Queen Mary College, Mile End Road, London El 4NS, UK
D S Urch
Affiliation:
Chemistry Department, Queen Mary College, Mile End Road, London El 4NS, UK
N G West
Affiliation:
Occupational Medicine and Hygiene Laboratories, Health and Safety Executive, 403 Edgware Road, London NW2 6LN, UK
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Abstract

High resolution x-ray emission spectroscopy (HRXES) has been used to record the Si Kβ spectra of a variety of minerals. Distinct changes in peak profile can be related to mineral typo. Representatives spectra were chosen and incorporated, into a computer programme to allow the determination of free silica in binary and quaternary mixtures. The potential of HRXES for the analysis of airborne dust samples is discussed.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 177 - 183
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Dodd, C.G. and Glen, G. L. 1969, A survey of chemical bonding in silicate minerals by X-ray emission spectroscopy, Am. Mineral., 54: 1299.Google Scholar
2. Esmail, E. I. , Nicholls, C.J. and Urch, D. S. , 1973, The detection of light elements by X-ray emission spectroscopy with use of low energy sate11ite peaks, Analyst, 98: 725.Google Scholar
3. Haycock, D.E. and Urch, D.S. , 1982, Resolution enhancement for a commercial X-ray fluorescence spectrometer, J. Phys. E;Sci. Instrum., 15 : 40.Google Scholar
4. Hurley, R.G. and White, E. W. , 1973, Rapid new soft x-ray technique for determination of quartz in coal, mine dusts, Am. Ind. Hyg, Ass, J. , 34: 229.Google Scholar
5. Pickard, K. J. , Walker, R.F. and west, N.G. 1985, A comparison of X-ray diffraction and infra-red spectrophotometric methods for the analysis of α-quartz in airborne dusts, Ann. Occup. Hyg., 29: 149.Google Scholar
6. Purton, J.A. and Urch, D.S. , (in press). High resolution Si KB X-ray spectra and crystal structure, Min. Mag.Google Scholar
7. Tossel, J.A. , 1975, The electronic structures of silicon, aluminum, and magnesium in tetrahedral co-ordination with oxygen from SCF-Xα. MO calculations, J. Am. Chem. Soc. , 97: 4840.Google Scholar
8. J. A., Tossell , Vaughan, D.J., and Johnson, K.H., 1973, X-ray emission and UV spectra of SiO2 calculated by the SCF Xα scattered wave method, Chem, Phys. Lett., 20: 329.Google Scholar
9. Urch, D.S. , 1970, The origin and intensities of low energy satellite lines in X-ray emission spectra: A molecular orbital interpretation, J. Phys. C. , 3: 1275.Google Scholar
10. Wiech, G and Kurmaev, E.Z. , 1985, X-ray emission bands and electronic structure of crystalline and vitreous silica (SiO2) , J. Phys. C., 18: 4393.Google Scholar