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A Guinier Diffractometer with a Scanning Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

Herbert E. Göbel
Herbert E. Göbel*
Affiliation:
Forschungslaboratorlen der Siemens AG D 8000 München 83, West Germany
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Abstract

A strictly focussing Guinier diffractometer using a linear position-sensitive proportional counter (PSPC) to detect the diffracted x-rays is described. The data collection time for a complete pattern can so be reduced to minutes Instead of hours as it used to be in conventional film- or counter-Guinier systems. The PSPC collects all diffracted x-rays over several degrees of 2 Theta in parallel and composes the full pattern by a continuous scan over the whole 2 Theta range. This principle was described in Adv. In X-Ray Anal. Vol. 22, 255 ff and 24, 123 ff. for Bragg-Brentano diffractometers.

Type
VII. XRD Methods and Instrumentation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 315 - 324
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

/1/ Weiner, K. L.: Guinier-System 600 Manual from R. HUBER Diffraktlonstechnik, 8211 Rimsting, W-GermanyGoogle Scholar
/2/ Goebel, H. E.: Adv. in X-Ray Anal. 22, 255–265 (1979)Google Scholar
/3/ Goebel, H. E.: Adv. In X-Ray Anal. 24, 123–138 (1981)Google Scholar
/4/ Kopp, M. K.: ESF-CNRS-EMBL Workshop on X-Ray Position-Sensitive Detectors, Hamburg, Nov. 17-21, 1980 Proc. to be published in Nucl. Inst. & Meth.Google Scholar
/5/ Dachs, H., Knorr, K.: J. Appl. Cryst. 5, 338–342 (1972)Google Scholar