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A General Computer Program for Particle Size and Strain Analysis

Published online by Cambridge University Press:  06 March 2019

C. P. Gazzara ,
J. J. Stiglich Jr. ,
F. P. Meyer  and
A. M. Hansen
C. P. Gazzara
Affiliation:
Army Materials and Mechanics Research Center, Watertown, Massachusetts
J. J. Stiglich Jr.
Affiliation:
Army Materials and Mechanics Research Center, Watertown, Massachusetts
F. P. Meyer
Affiliation:
Army Materials and Mechanics Research Center, Watertown, Massachusetts
A. M. Hansen
Affiliation:
Army Materials and Mechanics Research Center, Watertown, Massachusetts
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Abstract

A general computer program has been written in basic Fortran language and tested for computing average particle size, strain, and particle size distribution according to the Fourier method of B. E. Warren.

The program provides such optional features as input data and Fourier coefficient print out, automatic background correction, the choice of fixed count or fixed time input mode, the synthesized diffraction peaks deconvoluted with respect to the instrumental diffraction peak, and a variable amplification range of particle Size. Included in the analysis is a polynomial fitting procedure for the scattering factor. The authors have attempted to write this computer program to be as self-explanatory as possible for general applicability. This program is available on request.

This Fourier analysis program has been tested using known distribution functions, and has been used for measuring average particle size, particle size and strain distribution in heattreated boron-doped graphite samples.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 257 - 268
Copyright
Copyright © International Centre for Diffraction Data 1968

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References

1. Klug, H. P. and Alexander, L. E., “X-Ray Diffraction Procedures,” John Wiley and Sons, Inc., New York, 1954, Chapter 9.Google Scholar
2. Taylor, A., “X-Ray Metallography,” John Wiley and Sons, Inc., New York, 1961, Chapter 14.Google Scholar
3. Warren, B. E., “X-Ray Studies of Deformed Metals,” Progress in Metal Physics, 8:147, 1959.Google Scholar
4. Stokes, A. R., “A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-Ray Powder Photographs,” Proc. Phys. Soc. (London) 61 :382, 1948.Google Scholar
5. Smith, V. H. and Simpson, P. G., “Crystallite Size Distributions from X-Ray Powder Line Profiles,” J. Appl. Phys. 36:10, 3285, 1965.Google Scholar
6. Katz, R. N. and Gazzara, C. P., “The Influence of Boron Content on the Fine Microstructure of Pyrolytic Graphite,” J. Mtrls. Sci. 3 :61, 1968.Google Scholar
7. Rachinger, W. A., “Correction for the α1α2 Doublet in the Measurement of Widths of X-Ray Diffraction Lines,” J. of Sci. Inst. 25:254, 1948.Google Scholar