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Focusing W Kα1 with a Curved Si Crystal

Published online by Cambridge University Press:  06 March 2019

M. A. Short
Affiliation:
SRS Technologies, 3501 Jamboree Road, #402 Newport Beach, CA 92660
M. R. Fallon
Affiliation:
SRS Technologies, 3501 Jamboree Road, #402 Newport Beach, CA 92660
D. J. Nagel
Affiliation:
Naval Research Laboratory, Code 4600 Washington, DC 20375-5000
C. M. Dozier
Affiliation:
Naval Research Laboratory, Code 4600 Washington, DC 20375-5000
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Extract

The design, construction and operation of toroidal focusing X-ray monochromators have been described in detail by Marcus, et al. (1980) and by Furnas, et al. (1982), Marcus, et al. used 100 mechanically damaged, singly bent LiF (200) (2d = 4.02 Å) single crystals in a toroidal array to focus Cu Kα characteristic X-rays (8.04 keV, 1.54 Å, Θ = 22.6 deg). The diameter of the LiF toroid was 166 mm and the source-detector distance was 400 mm. Furnas, et al. used a series of singly bent, highly oriented graphite (2d = 6.72 Å) crystals, also in a toroidal array, to focus Pb Lα, Se Kα, Th Lα and U Lα X-rays (10.5 - 13.6 keV, 1.18 - 0.91 Å, Θ= 10.1 - 7.8 deg). Their system dimensions were not disclosed. The LiF and graphite crystals were both curved along the direction of X-ray propagation. That is, the cylindrical axes were orthogonal to the X-ray path.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

Criss, J.W., Birks, L.S., Gilfrich, J.V., 1978, Anal. Chem., 50:33.Google Scholar
Dozier, C.M., Gilfrich, I.V., Birks, L.S., 1967, Appl. Opt., 6:2136.Google Scholar
Dozier, C.M., Brown, D.B., Birks, L.S., Lyons, P.B., Benjamin, R.F., 1976, J. Appl. Phys., 47:3732.Google Scholar
Furnas, T.C., 1986, Personal Communication.Google Scholar
Furnas, T.C., Kuntz, G.S., and Furnas, R.E., 1982, Adv. in X-rav Anal., 25:59.Google Scholar
Marcus, M., Power, L.S., Storm, A.R., Kincaid, B.M. and Chance, B., 1980, Rev. Sci. Inst., 51:1023.Google Scholar
Salem, S.I., & Lee, P.L., 1976, Atom. Nucl. Data Tables. 18:233.Google Scholar
Short, M.A., & Fallon, M.R., 1990, X-Ray Spectrom., 19:35.Google Scholar
Warren, B.E., 1969, “X-Ray Diffraction,” p. 329, Addison-Wesley.Google Scholar