Published online by Cambridge University Press: 06 March 2019
The intensities of x-rays scattered by amorphous Fe80P13C7 and Fe40Ni40P14B6 samples have been measured as a function of photon energies E at fixed scattering angles 2θi using a Li-drifted Si detector and polychromatic x-rays generated by a 50KV full-wave rectified generator. The coherently scattered intensity per atom was calculated for free-standing samples as well as samples contained in a Be or pyrolytic graphite cell, after the evaluation of the energy dependence of the primary beam spectrum by an iterative process. The interference functions were then calculated from the data obtained in transmission and reflection, and compared with those measured with the conventional variable 2θ technique. Good agreement between energy-dispersive diffraction (also called variable wavelength technique) and variable 2θ diffraction was observed in all cases.