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Energy Dispersive X-ray Fluorescence Analysis Using Synchroton Radiation

Published online by Cambridge University Press:  06 March 2019

Atsuo Iida ,
Yohichi Gohshi  and
Tadashi Matsushita
Atsuo Iida
Affiliation:
Department of Industrial Chemistry, University of Tokyo, HongoBunkyo-kuTokyo 113Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, University of Tokyo, HongoBunkyo-kuTokyo 113Japan
Tadashi Matsushita
Affiliation:
Photon Factory, National Laboratory for High Energy Physics Oho-machi, TsukubagunIbaraki 305, Japan
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Abstract

Trace element analyses by energy dispersive X-ray fluorescence measurements were made using synchrotron radiation from a dedicated electron storage ring at the Photon Factory in Japan. The continuum or the monochromatic beam was used for excitation. A crystal monochromator or two types of mirror systems were used for monochromatic excitation. A high signal to background ratio was attained with the crystal monochromator, while the highest absolute detectability was achieved with the mirror system. The minimum detection limita obtained from thin samples are of the order of 0.1 ppm or less than 0.1 pg. Furthermore the signal to background ratio was significantly improved by using an X-ray mirror as a sample support in which, external total reflection of exciting X-rays occured.

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 61 - 68
Copyright
Copyright © International Centre for Diffraction Data 1984

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