Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-08T00:25:15.050Z Has data issue: false hasContentIssue false
  • English
  • Français

Electro-Optical Systems for Dynamic Display of X-ray Diffraction Images

Published online by Cambridge University Press:  06 March 2019

Robert E. Green Jr.
Robert E. Green Jr.*
Affiliation:
The Johns Hopkins University, Baltimore, Maryland 21218
Get access

Abstract

Various electro-optical systems have been reported which permit intensification of X-ray diffraction patterns and thus a decrease in exposure time for recording and display of the X-ray images. Prior to 1966, all such electro-optical systems incorporated a large format X-ray image intensifier of the same type as conventionally used for medical and industrial fluoroscopy. In the past four years, a number of different systems have been reported which are superior to those developed prior to 1966. These systems may be grouped into two main categories, the large format variety for Laue diffraction applications, and the small format variety for topographic applications.

The purpose of the present paper is to describe the particular characteristics of both the large format and small format systems and to discuss the advantages and disadvantages associated with each type. Based on actual performance characteristics it will be shown that:

  1. 1. A multiple stage image intensifier system coupled to an external fluorescent screen is the most sensitive and only truly instantaneous system; it can be used with very weak X-ray intensities, the resolution is currently limited by the external fluorescent screen to 42μ the system is extremely versatile in that it can be used both for large format recording of Laue patterns as well as for small format recording of X-ray topographe; the system has a very long lifetime since nothing is altered by X-radiation.

  2. 2. An X-ray sensitive vidicon is the least sensitive; it must be used with extremely high intensity X-rays or long exposure times; the resolution is the highest at approximately 15μ and is limited by either bandwidth of the television system, the thickness of the X-ray sensitive target or the size of the electron beam at the target; due to the small size of the X-ray sensitive target the system can only be used for small format recording of X-ray topographs; the lifetime of the system is short since X-radiation causes degradation of the target.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 14: Nineteenth Annual Conference on Applications of X-ray Analysis, August 5-7, 1970 , 1970 , pp. 311 - 337
Copyright
Copyright © International Centre for Diffraction Data 1970

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Weyerer, H., “Kristalljustierung mit Röntgen-Bildverstarker, Acta Cryst. 14, 771–773 (1961).Google Scholar
Goetze, G. W. and Taylor, A., “Some Recent Developments in the Direct Viewing and High-Speed Recording of X- ray Diffraction Patterns,” in Mueller, W. M., Editor, Advances in X- ray Analysis, Vol. 5, p. 86–93, Plenum Press (1962).Google Scholar
Goetze, G. W. and Taylor, A., “Direct Viewing and Rapid Photographic Recording of X- ray Diffraction Patterns,” Rev. Sci. Instr. 33, 353–359 (1962).Google Scholar
Goetze, G. W. and Taylor, A., “Recent Applications of Transmission Secondary Emission Amplification,” in Marton, L., Editor, Advances in Electronics and Electron Physics, Vol. 16, p. 557–566, Academic Press (1962).Google Scholar
Carlson, R., Furnas, T. C. Jr., and Beard, D. W., “An X- ray Image Intensifier for Crystal Orientation,” Acta Cryst. 16, A148 (1963).Google Scholar
Euler, F., “Device for Rapid Orientation of Crystals by Direct-Image X- ray Technique,” Air Force Cambridge Research Laboratories, Instrumentation Papers No. 93, AD 630931 (1966).Google Scholar
Kennedy, S. W., “Rapid X- ray Diffraction Studies using Image Intensification,” Nature 210, 936–937 (1966).Google Scholar
Mokul'skaya, T. D. and Moku'skii, M. A., “Electron-Optical Recording of X- ray Diffraction,“ Sov. Phys. - Doklady (English Transl.) 11, 132–134 (1966).Google Scholar
Arndt, U. W. and Ambrose, B. K., “An Image Intensifier - Television System for the Direct Recording of X- ray Diffraction Patterns,” IEEE Trans. Nucl. Sci. NS-15, 92–94 (1968).Google Scholar
Green, R. E. Jr., and Reifsnider, K., “Dynamic X- ray Diffraction Study of Aluminum Crystals,” J. Metals 20, 83A (1968).Google Scholar
Reifsnider, K. and Green, R. E. Jr., “Image Intensifier System for Dynamic X- ray Diffraction Studies,” Rev. Sci. Instr. 19, 1651–1655 (1968).Google Scholar
Reifsnider, K. and Green, R. E. Jr., “Dynamic X- ray Diffraction Study of the Deformation of Aluminum Crystals,” Trans. Met. Soc. ATM.E2A5, 1615–1619 (1969).Google Scholar
Chikawa, J. and Fujimoto, L., “X- ray Diffraction Topography with a Vidicon Television Image System,” Appl. Phys. Letters 13, 387–389 (1968).Google Scholar
Chester, A. N., Loomis, T. C., and Weiss, M. M., “Diode Array Camera Tubes and X- ray Imaging,” Bell System Tech. J. 48, 345–382 (1969).Google Scholar
Chester, A. N. and Koch, F. B., “Instantaneous Display of X- ray Diffraction using a Diode Array Camera Tube,” in Barrett, C. S., Newkirk, J. B., and Mallett, G. R., Editors, Advances in X- ray Analysis, Vol. 12, p. 165–173, Plenum Press (1969).Google Scholar
Meieran, E. S., Landre, J. K., and O'Hara, S., “Direct Video Imaging of X- ray Topographs,” Appl. Phys. Letters 14, 368–371 (1969).Google Scholar
Lang, A. R. and Reifsnider, K., “Rapid X- ray Diffraction Topography using a High-Gain Image Intensifier,” Appl. Phys. Letters 15, 258–260 (1969).Google Scholar
Reifsnider, K., “Time-Resolved X- ray Diffraction Microscopy: Development of a New Technique,” Department of Engineering Mechanics, Virginia Polytechnic Institute, DEMVIP Rep. No. 4-2, (1969).Google Scholar
Blamoutier, M., “Un Tube de Prise de Vues Sensible aux Rayons X,” in Marton, L., Editor, Advances in Electronics and Electron Physics, Vol. 28A, p. 273–280, Academic Press (1969).Google Scholar
Driard, B., “Contrôle des Monocristaux par Tube Intensificateur de Luminance,” in Marton, L., Editor, Advances in Electronics and Electron Physics, Vol. 28B, p 931–937, Academic Press (1969).Google Scholar
Ball, J. and Furnas, T. C. Jr. , “The Application of a Dynamic Imaging Detector to X- ray Diffraction,” Paper presented at the American Crystallographic Association meeting, New Orleans, (1970).Google Scholar
“Dynamic Diffraction”, Picker Corporation Bulletin 4M70 (1970).Google Scholar
Ball, J. and Furnas, T. C. Jr., “Dynamic Display of X- ray Patterns,” 19th Annual Denver X- ray Conference: Applications of X- ray Analysis, Denver, Colorado, August (1970) (immediately preceding paper).Google Scholar
Rozgonyi, G. A., Haszko, S. E., and Statile, J. L., “instantaneous Video Display of X- ray Topographic Images with Resolving Capabilities Better than 15μ,“ Appl. Phys. Letters 16, 443–446 (1970).Google Scholar
Crowell, M. H. and Labuda, E. F., “The Silicon Diode Array Camera Tube,” Bell System Tech. J. 48, 1481-1528 (1969).Google Scholar
Zworkin, V. K. and Morton, G. A., Television, John Wiley and Sons, Inc. (1954).Google Scholar
Marton, L., Editor, Advances in Electronics and Electron Physics, Vol. 12 (1960), Vol. 16 (1962), Vol. 22 (1966), Vol. 28 (1969), Academic Press.Google Scholar
Nudelman, S., Editor, Photoelectronic Imaging Devices, Plenum Press (scheduled far publication Fall of 1970).Google Scholar
Schade, O. H. Sr., “Electron Optics and Signal Read-Out of High-Definition Return- Beam Vidicon Cameras,” RCA Review 31, 60–119 (1970).Google Scholar
Schade, O. H. Sr., (private communication). A second paper has been accepted by the J. Soc. Mot. Pic. Television Eng. for publication. Both papers will also appear in the two volume collection edited by Nudelman (Ref. 28).Google Scholar