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The Effect of the Kα Doublet Diffracted Peak Position on the Precision of the Lattice Constant

Published online by Cambridge University Press:  06 March 2019

C. P. Gazzara
C. P. Gazzara*
Affiliation:
Army Materials and Mechanics Research Center Watertown, Massachusetts 02172
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Abstract

The effect of the position of the X-ray unresolved Kα1 - Kα2 line doublets, diffracted from powder specimens, on the precision of the calculated lattice constant has been determined using a least-squares analysis. An analytical procedure to synthesize CuKα doublet X-ray diffraction peaks with X-ray characteristic lines (half widths ranging from 0.1° to 0.4° 26) has been applied in correcting the weighted wavelength of the doublet peak position. A series of correction curves was established from which the true 26 peak position of the weighted Kα wavelength could be determined from the measured 29 peak position.

Type
X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 161 - 169
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Vassamillet, L. F. and King, H. W., “Precision X-Ray Diffractometry Using Powder Specimens,” in W. M. Mueller et al., Editors, Advances in X-Ray Analysis, Vol. 6, p. 142–157, Plenum Press (1963).Google Scholar
2. Mueller, M. H., Heaton, L. and Miller, K. T., “Determination of Lattice Parameters with the Aid of a Computer,” ActaCryst., 13, 828–829 (1960).Google Scholar
3. Gazzara, C. P., “The Effect of Systematic Errors on the Measurement of Lattice Constants,” Army Materials and Mechanics Research Center, AMMRC TR 70-29 (September 1970).Google Scholar
4. Gazzara, C. P., “Peak Height Approximation for X-Ray Diffracted Integrated Intensity,” in Gould, R. W., Barrett, C. S., Newkirk, J. B. and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 19, p. 735–748, Kendall Hunt (1976).Google Scholar