Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-02T20:32:50.421Z Has data issue: false hasContentIssue false
  • English
  • Français

Double-Scanning Diffractometry in the Back-Reflection Region

Published online by Cambridge University Press:  06 March 2019

Hubert W. King  and
Carolyn M. Russell
Hubert W. King
Affiliation:
Imperial College London, England
Carolyn M. Russell
Affiliation:
Imperial College London, England
Get access

Abstract

A scanning range over Bragg angles from −163 to +163° 2θ is obtained by combining a diffractometer capable of scanning both sides of the primary X-ray beam with a very short (3-in.) high-power focused X-ray tube. The ability to scan the included angle 4θ between respective diffraction profiles on either side of the primary beam over the entire range of Bragg angles, provides a direct method of eliminating errors caused by a displacement of the specimen surface from the axis of the goniometer. The method is demonstrated by determining the lattice parameters of standard specimens used in the I.U.Cr. Precision Lattice Parameter Project.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 1 - 10
Copyright
Copyright © International Centre for Diffraction Data 1964

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Parrish, W., “Results of the I.U.Cr. Precision Lattice Parameter Project,” Acta Cryst. 13: 838, October 1960.Google Scholar
2. Vassamillet, L. F. and King, H. W., “Precision X-Ray Diffractometry Using Powder Specimens,” Advances in X-Ray Analysis, Vol. 6, William M. Mueller and Marie Fay (eds.), University of Denver, Plenum Press, New York, 1963, p. 142.Google Scholar
3. Wilson, A. J. C., “Geiger-Courtfer X-Ray Spectrometer—Influence of Size and Absorption Coefficient of Specimen on the Position and Shape of Diffraction Maxima,” J. Set. Instr. 27: 321, December 1950.Google Scholar
4. King, H. W. and Vassamillet, L. F., “Precision Lattice Parameter Determination by Double-Scanning Diffractometry,” Advances in X-Ray Analysis, Vol. 5, William M. Mueller (ed.), University of Denver, Plenum Press, New York, 1962, p. 78.Google Scholar
5. Vassamillet, L. F. and King, H. W., “Diffractometer Techniques,” Handbook of X-Rays, Section 2, III, McGraw-Hill, Book Co., Inc., New York (in press).Google Scholar
6. Delf, B. W., “The Practical Determination of Lattice Parameters Using the Centroid Method,” Brit. J. Appl. Phys, 14: 345, June 1963.Google Scholar
7. Franks, A., “The Precision Measurement of Lattice Parameters Using an X-Ray Back-Reflection Focusing Camera” (to be published).Google Scholar