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Diffraction Technique for Stress Measurement in Polymeric Materials

Published online by Cambridge University Press:  06 March 2019

Charles S. Barrett*
Affiliation:
Denver Research Institute University of Denver Denver, Colorado
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Abstract

Stresses in polymeric materials can be measured by diffracting X-rays from embedded crystallites that yield suitable powder diffraction lines. An appropriate technique for this has been, reported by C. S. Barrett and Paul Predecki elsewhere and is reviewed here with additional details. It is based on a diffractometer modified so as to operate at very high 26 angles, with specimens prepared in various ways. Results show that adequate precision is reached by scanning Ka doublet in a few minutes and simply noting any displacement of peaks compared with peaks from an unstressed specimen; higher precision can be reached with slower scans or more detailed analysis of the peaks. Tests with embedded metallic particles were successful when the particles were (A) distributed throughout a moulded polymethyl methacrylate (Lucite) sheet of the order of a millimeter thick, alone or sandwiched between layers of particle-free material, or (B) embedded in polyester resin applied to a surface of Plexiglas bars, or (C) embedded in graphite-fiber epoxy composites in a layer at a chosen position within a specimen.

Type
X-Ray Diffraction Stress Analysis
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Barrett, C. S. and Paul Predecki, , “Stress Measurement in Polymeric Materials by X-Ray Diffraction,” to appear in Polymer Science and Engineering.Google Scholar
2. Sakurada, I., Nukushina, Y. and Ito, T., “Experimental Determination of the Elastic Modulus of Crystalline Regions in Oriented Polymers,” Jour. Polymer Science 57, 651660 (1962).Google Scholar
3. Kontorovich, S. I., Lavrova, K. A., Davidov, V. V., Plavnik, G. M. and Shukin, E. D., “X-ray Investigation of Internal Stresses in Filled Polymers” (in Russian), Strukt. Svoista Proverkh. Sloev. Polim, 143147 (1972); Chemical Abstracts 79, 79660c.Google Scholar