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Development of a High Spatial Resolution X-Ray Fluorescence Element Mapping Spectrometer and its Application to Quantitative Analysis of Biological Systems

Published online by Cambridge University Press:  06 March 2019

Natsuo Fukumoto
Affiliation:
National Chemical Laboratory for Industry Tsukuba, Ibaraki, 305, JAPAN
Yoshinori Kobayashi
Affiliation:
National Chemical Laboratory for Industry Tsukuba, Ibaraki, 305, JAPAN
Masayasu Kurahashi
Affiliation:
National Chemical Laboratory for Industry Tsukuba, Ibaraki, 305, JAPAN
Akira Kawase
Affiliation:
National Chemical Laboratory for Industry Tsukuba, Ibaraki, 305, JAPAN
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Extract

We developed an X-ray fluorescence element mapping spectrometer (XEMS) based on commercially available energy dispersive XRF equipment several years ago. Using XEMS, we found that this technique is applicable to realtime observation of the elemental distributions in living biological samples. This kind of observation is almost impossible by conventional techniques such as EPMA, PIXE etc. But the spatial resolution of the previous system was about 200pm, Inferior by almost two orders to that of EPMA for example. So we developed a new spectrometer with an improved resolution of better than 20um and almost the same sensitivity.

Type
XV. X-Ray Imaging and Tomography
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Rindby, A., Engstrom, P., Arsson, S. I. and Stocklassa, B., Micro-beam technique for energy-dispersive X-ray fluorescence, X-ray spectrometry 18:109(1989)Google Scholar
2. Kohayashi, Y., Fukumoto, H., and Kurahashi, M., X-ray fluorescence elementmapping spectrometer with improved spatial resolution, Meas. Sci. Technol, 2: 183 (1991)10.1088/0957-0233/2/2/018Google Scholar