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Decomposition Spectrometric Data of Energy Dispersive X-Ray Fluorescence Analysis (EDXRF)

Published online by Cambridge University Press:  06 March 2019

V. I. Smolniakov  and
I. A. Koltun
V. I. Smolniakov
Affiliation:
Neutron Research Department, Leningrad Nuclear Physics Institute (LNPI), Academy of Sciences USSR 188350 Gatchina, Leningrad region, U.S.S.R.
I. A. Koltun
Affiliation:
Neutron Research Department, Leningrad Nuclear Physics Institute (LNPI), Academy of Sciences USSR 188350 Gatchina, Leningrad region, U.S.S.R.
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Abstract

It is well-known that in EDXRF, using high-resolution semiconductor detectors, evaluation of x-ray fluorescence radiation line intensities from multiplex spectrometric information represents definite difficulties, especially in automation of measurement-calculation procedures.

A common spectrum decomposition problem is to get the following parameters: a number of spectral lines and their centroids, intensities from measured experimental data and their errors.

We have developed special software for solving this problem using personal computers and high-level programming language C. It uses profiles of real-form lines of pure chemical elements produced by semiconductor detector spectrometers and these techniques: digital filters with parameters for suppression of background, multiplex structure analysis, and stable linear least-squares fit to get peak intensities. Also it established special criteria for reliability of the results.

We compared our investigation with software “EDXRF” (ver.1.32) arid spectrum decomposition with Gaussian peaks.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 743 - 748
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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