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Correction for Non-Linearity of Proportional Counter Systems in Electron Probe X-Ray Microanalysis

Published online by Cambridge University Press:  06 March 2019

Kurt F. J. Heinrich ,
Donald Vieth  and
Harvey Yakowitz
Kurt F. J. Heinrich
Affiliation:
National Sureau of Standards, Washington, D.C.
Donald Vieth
Affiliation:
National Sureau of Standards, Washington, D.C.
Harvey Yakowitz
Affiliation:
National Sureau of Standards, Washington, D.C.
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Abstract

While the theoretical basis for the correction of non-linearity of detector systems is well known, methods for the determination of dead-time effects must be adapted to electron probe microanalyzer systems. Two such methods, one employing both X-ray and current measurements and the other employing simultaneous X-ray measurements on two spectrometers, are described. The effect of pulse-height shrinkage at high counting rates on the linearity of the detector system is discussed. When the proposed corrections for the dead-time of X-ray detector systems employing proportional counters are applied to the X-ray intensity measurements obtained with the electron probe microanalyzer, count rates as high as 50,000 counts/sec can be used.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 208 - 220
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Friedman, H., Electronics 18: 132, 1945.Google Scholar
2. Lonsdale, K., Acta Cryst. 1: 12, 1948.Google Scholar
3. Schrff, L. J., Phys. Rev. 50: 88, 1936.Google Scholar
4. Ruark, A. and Brammer, F. E., Phys. Rev., 52: 322, 1937.Google Scholar
5. Hole, N., Arkiv. Mat., Astro. Pys. 33A (H), 1947.Google Scholar
6. Jost, R., Helv. Phys. Acta 20: 173, 1947.Google Scholar
7. Beckman, M. and Michiels, J. L., Proc. Phyt. Soc. (London) 60: 594, 1948.Google Scholar
8. Evans, R. D., The Atomic Nucleus, MacGraw-Hill Book Company, Inc., New York, 1955.Google Scholar
9. Wittry, D. B., in: X-Ray and Electron Probe Analysis, ASTM Special Technical Publication No. 349, ASTM, 1963.Google Scholar
10. Short, M. A., Rev. Sci. Inst. 31: 618, 1960.Google Scholar
11. Bender, S. L. and Rapperport, E. J., “The Electron Microprobe,” in: Proceedings of the Symposium on Electron Probe Microanalysis, Electrochemical Society, John Wiley & Sorts, Inc., New York, 1966.Google Scholar
12. Heinrich, K. F. J., in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol 7, Plenum Press, New York, 1963, p. 325.Google Scholar
13. Petzold, W., Z. Angeio. Phys. 15: 158, 1963.Google Scholar
14. Heinrich, K. F. J., to be published.Google Scholar