Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-08T01:56:06.517Z Has data issue: false hasContentIssue false
  • English
  • Français

Computer Techniques for Faster X-Ray Diffraction Phase Identification

Published online by Cambridge University Press:  06 March 2019

Raymond P. Goehner  and
Mary F. Garbauskas
Raymond P. Goehner
Affiliation:
General Electric Company, Corporate Research and Development, PO Box 8, Schenectady, New York 12301
Mary F. Garbauskas
Affiliation:
General Electric Company, Corporate Research and Development, PO Box 8, Schenectady, New York 12301
Get access

Abstract

This paper describes the procedures used to retrieve JCPDS powder diffraction data by certain characteristics. These characteristics may include chemistry, mineral name, highest intensity dspacing, largest dspacing, PDF number, etc. The storage scheme used for the powder data and the procedures used to enhance the retrieval speed are described.

Type
I. J. D. Hanawalt Award Session on Search/Match Methods
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 21 - 26
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Goehner, R.P. and Garbauskas, M.F., “Computer-Aided Qualitative X-ray Powder Diffraction Phase Analysis,” Adv. in X-ray Analysis, 26, pp. 81–86, 1983.Google Scholar
2. Goehner, R.P. and Garbauskas, M.F., “PDIDENT-A Set of Complete Programs For Powder Diffraction Phase Identification”, General Electric Technical Information Series, 83CRD062, Schenectady, NY 1983.Google Scholar
3. Joint Committee on Powder Diffraction Standards, International Centre For Diffraction Data, 1601 Park Lane, Swarthmore, PA 19081.Google Scholar