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Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts

Published online by Cambridge University Press:  06 March 2019

Kenji Sakurai ,
Atsuo Iida  and
Yohichi Gohshi
Kenji Sakurai
Affiliation:
Department of Industrial Chemistry, University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo 113, Japan
Atsuo Iida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics 1-1, Oho, Tsukuba, Ibaraki 305, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo 113, Japan
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Recently synchrotron radiation (SR) sources have been extensively used for the study of materials science. The high intensity of tunable monochromatic X-rays from SR facilitates many types of spectroscopic/ diffraction studies which have otherwise not been possible. Regarding the X-ray fluorescence technique, significant improvement of the minimum detection limit has been performed and has enabled trace element analysis in the order of tens of ppb or 10-12 g.3-8 SR microanalyzers and near surface analysis using grazing incidence geometry are also attractive applications of synchrotron X-ray fluorescence technique. From a point of materials characterization, chemical state analysis is not less important than ordinary element analysis.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 167 - 176
Copyright
Copyright © International Centre for Diffraction Data 1988

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