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Application of Fundamental Parameter Software to On-Line XRF Analysis

Published online by Cambridge University Press:  06 March 2019

D.J. Leland ,
D.E. Leyden  and
A.R. Harding
D.J. Leland
Affiliation:
Department of Chemistry, Colorado State University, Fort Collins, CO 80523
D.E. Leyden
Affiliation:
Department of Chemistry, Colorado State University, Fort Collins, CO 80523
A.R. Harding
Affiliation:
Tracor Xray, Inc., Mountain View, CA 94043
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Extract

X-ray fluorescence analysis (XRF) is an analytical method which has been adapted with considerable success to on-line industrial process analysis with various degrees of sophistication. Process analysis XRF systems range from relatively simple units utilizing radioisotope sources with non-dispersive analyzers to complex wavelength dispersive systems in a central location receiving samples from a number of process streams. The advantages of on-line process analytical instrumentation for quality control, regulatory 2 compliance and safety considerations are well documented. ' Advances in the development of low maintenance thermoelectrically cooled Si(Li) detectors have made energy dispersive X-ray fluorescence analysis (EDXRF) even more amendable to on-line process analysis. EDXRF is an important method of on-line instrumentation because of its ability to simultaneously detect many elements.

Type
II. On-Line X-Ray Analysis
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 39 - 44
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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