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An In Situ XRD Technique For Annealing Investigations

Published online by Cambridge University Press:  06 March 2019

D.E. Koylman ,
S.C. Axtel  and
B.W. Robertson
D.E. Koylman
Affiliation:
Center for Materials Research and Analysis Department of Mechanical Engineering University of Nebraska-Lincoln Lincoln, Nebraska 68588-0656
S.C. Axtel
Affiliation:
Center for Materials Research and Analysis Department of Mechanical Engineering University of Nebraska-Lincoln Lincoln, Nebraska 68588-0656
B.W. Robertson
Affiliation:
Center for Materials Research and Analysis Department of Mechanical Engineering University of Nebraska-Lincoln Lincoln, Nebraska 68588-0656
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Abstract

An in situ XRD technique employing a diffractometer equipped with a high temperature camera was used to investigate the annealing behavior of nanoerystalline copper powder produced by mechanical milling. Specimens were annealed isothermally for 12 h at temperatures between 480 and 770 K. The diffraction data was analyzed using a single-profile Fourier analysis technique. The activation energy for diffracting particle growth was determined to be 0.45 eV/atom.

Type
X. Structural and Other Applications of Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 757 - 762
Copyright
Copyright © International Centre for Diffraction Data 1994

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