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An Expert System for the Validation and Interpretation of X-ray Residual Stress Data

Published online by Cambridge University Press:  06 March 2019

Marc Tricard ,
Robert W. Hendricks  and
Marc Guillot
Marc Tricard
Affiliation:
Virginia Polytechnic Institute and State University Blacksburg, VA
Robert W. Hendricks
Affiliation:
Virginia Polytechnic Institute and State University Blacksburg, VA
Marc Guillot
Affiliation:
Ecole Nationale Superieure des Arts et Metiers Paris, France
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Abstract

Although widely recognized in the research community as one of the most accurate non-destructive methods for the determination of . residual stress in polycrystalline structural materials, x-ray diffraction has not been widely adopted in the field. This is partly due to the fact that such measurements require, most often, a well trained user with knowledge in both materials and mechanical sciences in addition to the specific know-how of the instrument. We believe that computer assistance could contribute to the promotion of this technique by increasing the productivity and accuracy of these measurements. We have developed a prototype expert system, using Nexpert Object's shell, to assist a non-trained operator in the validation and interpretation of X-ray diffraction residual stress data.

The present work describes this prototype which has been designed to confirm the feasibility of the concept. Its knowledge base contains relevant examples of the rules necessary for data validation. The prototype has also confirmed most of the concepts required for the implementation of a full-scale version by evaluating all of the major technical features such as graphics representation, external routines and database access.

Type
XII. Analysis of Stress and Fracture by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 601 - 610
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

[1] Dehan, C. F., An Intelligent Workstation for Reliable Residual stress Determination Using X-ray Diffraction, M. S. Thesis, Virginia Polytechnic Institute and state University, Blacksburg, Virginia 24061, (July 1989).Google Scholar
[2] Dehan, C. F., Hendricks, R. W., and Roach, J. W., “An Intelligent Workstation for Stress Determination Using X-ray Diffraction”, in International Conference on Residual Stresses — ICRS2, G. Beck, S. Denis, and A. Simon, eds., Nancy, France, 22-26 November, 1988, London: Elsevier Applied Science, pp.39-45, (1989).Google Scholar
[3] Potet, Tricard, J. M., and Hendricks, R. W., “A data transfer program for the TEC x-ray stress analysis system: User Guide”, Virginia Polytechnic Institute and State University, Materials Engineering Dept Report, RSL-005, (October, 1990).Google Scholar
[4] Courtney, Tricard, S. M. and Hendricks, R. W., “A residual stress database management system”. Senior thesis research progress report, Virginia Polytechnic Institute and State University, Materials Engineering Dept, (October, 1990).Google Scholar
[5] See for example: Rasmus, D., A Nexpert Review, Mac User, September 1989, pp. 137-160.Google Scholar
[6] “Microsoft puts Windows 3.0 to work”, PC week, May 28, 1990, p. 57.Google Scholar