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Advances in Boron Measurement with Wavelength Dispersive XRF
Published online by Cambridge University Press: 06 March 2019
Extract
Over recent years, the availability of man made “crystals“ (Layered Synthetic Microstructures or Multilayers) has led to a significant extension of the capabilities of WD XRF for the lighter elements. In particular, the elements from Atomic Number 5 (Boron) to Atomic Number 12 (Magnesium) have benefitted.
This paper will cover the lower end of this range and show how selection of multilayers is made. It will then consider the optimization of collimation to suit The performance characteristics of the multilayer device. One of many new applications opened up by these advances will be covered in detail (analysis of Boron in BPSG coatings on Silicon Wafers). Finally, a word of warning will be issued to those seeking to apply this newfound performance in routine XRF environments.
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- III. Long-Wavelength X-Ray Spectrometry
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- Copyright © International Centre for Diffraction Data 1990