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X-Ray Diffraction from a 28 Attoliter Crystal Volume

Published online by Cambridge University Press:  06 March 2019

E.F. Skelton ,
J.D. Ayers ,
S.B. Qadri ,
J.Z. Hu ,
L.W. Finger  and
H.K. Mao
E.F. Skelton
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
J.D. Ayers
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
S.B. Qadri
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
J.Z. Hu
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
L.W. Finger
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
H.K. Mao
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
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Abstract

Metallic filaments with sub-micrometer diameters have recently been fabricated using novel materials fabrication techniques at NRL. The specimens are enshrouded in a glass sheath and all efforts to obtain structural information from these samples with conventional x-ray sources have been negative. By using synchrotron radiation on a wiggler beam line, x-ray diffraction data have been obtained from samples with diameters of 0.22, 0.09, 0.07, and 0.04 μm. The two thicker samples were found to be single crystals with a structure consistent with that of normal Bi. Single crystal diffraction peaks obtained from the 0.07 μm sample are incompatible with the Bi-1 or any other known structure of Bi. We have provisionally identified this as Bi-X.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 617 - 621
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1 Taylor, G.F., Phys. Rev. 24, 655 (1924)Google Scholar
2 Skelton, E.F., Ayers, J.D., Qadri, S.B., Moulton, N.E., Cooper, K.P., Finger, L.W.. Mao, H.K., and Z. Hu, Science 253, 1123 (1991)Google Scholar
3 Skelton, E.F., Acta Crystallog. Sect. A 32, 467 (1976)Google Scholar
4 Finger, L.W. and Hadidiacos, C.G., X-ray Diffiactometer Control System (Krisel Control. Ins., Rockville, MD, 1982).Google Scholar
5 X-ray Powder Data File (American Society for Testing Materials, Philadelphia, 1960), #5-0519Google Scholar
6 Eisenberger, P., Newsam, J.M., Leonowicz, M.E., D. E. W. Vaughan, Nature 309, 45 (1984)Google Scholar
7 Bachmann, R., Kohler, H., Schulz, H., H-P Weber. Acta Cryst. A41, 35 (1985)Google Scholar
8 Rieck, W., Euler, H., Schulz, H., Schildkamp, W., Acta Cryst. A44, 1099 (1988)Google Scholar
9 Ohsumi, K., Hagiya, K., and Ohmasa, M., J. Appl. Cryst. 24, 340 (1991)Google Scholar
10 Homan, C.G., J. Phys. Chem. Solids 36, 1249 (1975).Google Scholar
11 Finger, L. W. et al., to be submitted to Science Google Scholar