Hostname: page-component-745bb68f8f-grxwn Total loading time: 0 Render date: 2025-02-05T00:20:03.771Z Has data issue: false hasContentIssue false
  • English
  • Français

Separation of Kα Doublet for Profile Analysis by Use of FFT

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka  and
Shinichi Ohya
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology, 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
Shinichi Ohya
Affiliation:
Musashi Institute of Technology, 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
Get access

Extract

Line-profile analysis is important for material evaluation as well as x-ray stress analysis. In the general case, the half-value breadth of the Kα doublet is used as the line-profile parameter, but it is preferable to use the half-value breadth of the Kα1 diffraction profile because of high resolution.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 623 - 629
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1) Taira, S., Yoshioka, Y. and Sakata, T.; Proc. 9th Japan Cong, on Testing Materials. pp 48-53(1966)Google Scholar
2) Ohya, S. and Yoshioka, Y.; Adv. X-Ray Analysis, 33, pp 397–402 (1990)Google Scholar
3) Yoshioka, Y. and Majima, H.; Fracture Mechanics and Technology, 11, pp 1573–1584(1977)Google Scholar