Hostname: page-component-745bb68f8f-kw2vx Total loading time: 0 Render date: 2025-01-11T13:30:44.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite

Published online by Cambridge University Press:  06 March 2019

X. Zhu ,
P. Predecki ,
M. Eatough  and
R. Goebner
X. Zhu*
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
P. Predecki
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
M. Eatough
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
R. Goebner
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
*
†Current address: Oak Ridge National Laboratory, P.O. Box 2008, MS 6064, Oak Ridge, TN 37831.
Get access

Abstract

This study uses the asymmetric grazing incidence x-ray diffraction (GIXD) method and related z-profile retrieval techniques to study the near surface residual stress depth proflles on ground and on polished surfaces of hot-pressed Al2O2SiC(w) composite specimen. The z-profiles of stress components σ11, σ22 and σ33 of the Al2O3 matrix were obtained by using the numerical inversion method as well as the inverse Laplace method. Both τ- and z-profiles of residual stresses are presented.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 371 - 380
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Abuhasan, A. Balasingh, C. and Predecki, P. (1990), J. Am. Ceram. Soc., 73[8], 2474-2484.Google Scholar
Ballard, B., Zhu, X. and Predecki, P., (1994) “Depth Profiling of Residual Stresses by Asymmetric Grazing Incidence X-ray Diffraction (GIXD)”, Proceedings of the International Conference on Residual Stresses, Baltimore, MD, June 1994.Google Scholar
Eigenmann, B., Scholtes, B. and Macherauch, E. (1989) “Determination of Residual Stresses in Ceramics and Ceramic-Metal Composites by Diffraction Methods. ” Materials Science and Engineering, All8, 1-17.Google Scholar
Phillips, D. L. (1962) “A Technique for the Numerical Solution of Certain Integral Equations of die First Kind”, Journal of the Association for Computing Machinery, Vol. 9, pp. 84–97.Google Scholar
Predecki, P. K. (1993) “Determination of depth profiles from x-ray diffraction data”, Powder Diffraction, 812], 122–126.Google Scholar
Roll, E. D., Pangborn, R. N. and Amateau, M. F., (1987) “Non-destructive Characterization of Materials II”, 595-603, Plenum, New York.Google Scholar
Twomey, S. (1963) “On the Numerical Solution of Fredholm Integral Equations of the First Kind by the Inversion of the Linear System Produced by Quadrature”, Journal of the Association for Computing Machinery, Vol. 10, pp. 97–101.Google Scholar
Winholtz, R. A. and Cohen, J. B. (1988), “Generalized Least-squares Determination of Triaxial Stress States by X-ray Diffraction and the Associated Errors”, Australia J. Phys., 41, 189–99.Google Scholar
Zhu, X., (1995) “Residual Stress Depth Profiling Using X-ray Diffraction”, Ph. D. thesis, University of Denver.Google Scholar
Zhu, X., Ballard, B. and Predecki, P., (1995) “Determination of z-Profiles of Diffraction Data From T-profiles Using a Numerical Linear Inversion Method”, Advances in X-ray Analysis, 38, in press.Google Scholar
Zhu, X., Predecki, P. and Ballard, B., (1995) “Comparison of Inverse Laplace and Numerical Inversion Method for Obtaining z-Depth Profiles of Diffraction Data”, Advances in X-ray Analysis, 38, in press.Google Scholar