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Quantitative X-Ray Fluorescence Analysis With Variable Take-Off Angle

Published online by Cambridge University Press:  06 March 2019

H. Ebel
H. Ebel*
Affiliation:
Institut für Angewandte Physik, University of Technology and Ludwig Boltzmann-Institut für Festkörperphysik, Vienna, Austria
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Abstract

A solution of the intensity equation of X-ray Fluorescence analysis is possible either by the assumption of an effective wave length or by a variation of the take-off angle. When the intensity of the fluorescence radiation is measured as a function of the take-off angle, the extrapolation of this curve against take-off parallel to the flat sample surface offers a simple evaluation of the intensity equation. Since the influence of the secondary excitation is also taken in to account the composition and the mass per unit area of samples can be investigated as well as mass absorption coefficients and mean wavelengths of the polychromatic primary radiation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 13: Eighteenth Annual Conference on Applications of X-ray Analysis, August 6-8, 1969 , 1969 , pp. 68 - 79
Copyright
Copyright © International Centre for Diffraction Data 1969

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References

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