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A Noval X-ray powder Diffractometer Detector System

Published online by Cambridge University Press:  06 March 2019

Susan K. Byram
Affiliation:
Syntex Analytical Instruments, Inc. Cupertino, California 95014
Bui Han
Affiliation:
Syntex Analytical Instruments, Inc. Cupertino, California 95014
G. B. Rothbart
Affiliation:
Syntex Analytical Instruments, Inc. Cupertino, California 95014
Roger N. Samdahl
Affiliation:
Syntex Analytical Instruments, Inc. Cupertino, California 95014
Robert A. Sparks
Affiliation:
Syntex Analytical Instruments, Inc. Cupertino, California 95014
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Abstract

A new proportional counter x-ray detector with application for powder diffractometry has been developed. The new detector collects virtually the entire diffraction spectrum simultaneously with good efficiency and angular resolution. Thus, the powder spectrum of a small sample can be obtained much faster than with film or a conventional powder diffractometer. The detector read-out is digital and is interfaced to a dedicated minicomputer. A description of the detector system is discussed and preliminary results are presented.

Type
X-Ray Instrumentation
Copyright
Copyright © International Centre for Diffraction Data 1976

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