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Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line

Published online by Cambridge University Press:  06 March 2019

J.V. Gilfrich ,
E.F. Skelton ,
S.B. Qadri ,
N.E. Moulton ,
D.J. Nagel  and
J. Z. Hu
J.V. Gilfrich
Affiliation:
Naval Research Laboratory Washington, DC 20375-5000, USA
E.F. Skelton
Affiliation:
Naval Research Laboratory Washington, DC 20375-5000, USA
S.B. Qadri
Affiliation:
Naval Research Laboratory Washington, DC 20375-5000, USA
N.E. Moulton
Affiliation:
Naval Research Laboratory Washington, DC 20375-5000, USA
D.J. Nagel
Affiliation:
Naval Research Laboratory Washington, DC 20375-5000, USA
J. Z. Hu
Affiliation:
Carnegie Institute of Washington Washington, DC
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Abstract

It has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.

Type
XIII. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 995 - 1000
Copyright
Copyright © International Centre for Diffraction Data 1991

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